Hitachi s 4700

Hitachi S-4700 FEGSEM Computer Startup and Gun Flash Procedure The flash procedure helps to establish stable operation of the cold field-emission electron gun by driving excess adsorbed gas molecules from the guns cathode, or electron emitter. This is done by briefly heating the cathode to high temperature.

Hitachi s 4700. FE-SEM Microanalysis. Hitachi S-4700 FE-SEM Training Index. X-Ray Spectral Analysis. X-Ray Mapping. Microanalysis: X-Ray Spectral Analysis. Top. FE-SEM Microanalysis …

S-4700の新しい二次電子検出法の特長と応用 (533KB) 詳細リンク: sem107: 概要: 近年、半導体デバイスの例にみられるように多くの分野でプロセスの微細化や材料の複合化が進められています。

Hitachi S-4700-II SEM. Location: CA USA. Condition: Refurbished Hitachi S-4700-II. Type II stage with 5 axis motorization . Type I load lock, 4 inch (optional 6 inch) . Full control pad . CD Measurement . Turbo Pump . Upgrade to Windows XP Pro. Valid time: Subject to prior sale without notice. Appreciate your time. Price: Pls email us.Hitachi S-4700 FE-SEM; FE-SEM Microanalysis; Also in this section. Instrumentation. FEI 200kV Titan Themis STEM; Hitachi FB-2000A FIB; Hitachi S-4700 FE-SEM. Introduction; Basic Science; External Components; Internal Components; Software; Safety Procedures; Operating Procedure; Imaging Techniques; Microanalysis; FAQs;The faster scanning speeds (Fast 1 and 2) are used most commonly for regular live viewing of images. An image can be captured in Fast 1 to eliminate the visible effects of charging on a sample. Clarity is lost, however, as the image appears grainy. Fast speeds 1 and 2 are used for fine focus and astigmatism correction.SEM / TEM / FIB : HITACHI S-4700 I - Specification: Secondary electron image resolution: 2.1nm at 1kV 1.5nm at 15kV and WD = 12mm or X-ray analysis position Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Type I: X: 0 ~ 25mm; Y: 0 ~ 25mm, Z: 1.5 ~ 26.5mm; T: -5 ~ +45 deg, R: 360 deg. 100 loadlock 2 axis motorization, …HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This …

objective lens in the Hitachi S-4700 is a “snorkel” lens (Figure 2) which has low aberrations (described below), and it can accommodate large specimens. In addition, it can simultaneously accommodate both a lower (i.e., an E-T) and an upper (through-the-lens) secondary electron detector as described below, providing valuableIf the knobs are not positioned at X = 12.5 mm and Y = 12.5 mm, manually rotate the knobs on the stage until they come to that position. Then enter their values into the X and Y windows on the computer screen. This is the end of the Hitachi S-4700 FE-SEM training module. Troubleshooting software, imaging, dropped specimen, chamber vacuum, and ...a Hitachi S-4700 SEM in the Scanning Microscopy Laboratory of Biological and Geological Sciences of the Jagiellonian University. In addition more than 40 traps of G. /obata * G. violacea f. Giant were removed from the soil, cut and observed by light microscopy to check what kind of soil organisms could be found inside them. ...hitachi 4700 fe-sem cold field emmision starting conditions specimen loading sample insertion sample withdrawal set image parameters obtaining an image alignment general…The scanning electron microscopy (SEM) images were obtained using a HITACHI S-4700 field emission SEM (Hitachi, Tokyo, Japan). The surface characteristics were measured on a surface area and porosity analyzer ASAP 2020 HD88 (Micromeritics, Atlanta, Georgia, USA). Thermogravimetric analysis (TGA) was carried out on …The morphological analyses were conducted using a field-emission scanning electron microscope (FE-SEM, Hitachi, S-4700) as well as a transmission electron microscope (TEM, JEOL JEM 2100-2100F). The electrochemical measurements with an Autolab electrochemical workstation using different electrolytes such as 3 M KOH and 1 …

Recently, we traded a Hitachi tungsten (W) scanning electron microscope and replaced it with a Hitachi S-4700 cold field emission SEM running on SEMView8000 ...Hitachi · Produkty · Pompy ciepła; YUTAKI S. – YUTAKI S. YUTAKI S_header. – YUTAKI S. Pompa ciepła typu split powietrze-woda Nominalne moce grzewcze: 4 - 24 kW.SEM Hitachi S-4700 user manual. 1. Warnings and recommendations. Be sure to read the following remarks: 1.1. This equipment belongs to VAN Partners. Let's handle it with much care, 1.2. Before exchanging the sample, always check that the stage is in its initial position: HITACHI S4700 SEM MANUAL >> DOWNLOAD HITACHI S4700 SEM MANUAL >> READ ONLINE hitachi su3500 sem manual hitachi s 4500 manualhitachi sem training jeol sem manual. 1 Mar 2012 Hitachi assumes no liability for any direct, indirect, or In the S-5200, as in the case of the S-4700, you can switch the high-resolution CD-SEM …SEM & TEM : HITACHI S-4700 - : See Full Gallery (0 Photos) No Longer Available

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SEM / TEM / FIB : HITACHI S-4700 - : See Full Gallery (0 Photos) No Longer Available10 Hitachi S-4700 Manual-Updated 032117_08012018 . SET IMAGING PARAMETERS * [From OLD version] Switch GUN VALVE to OPEN/AUTO. The valve can be kept on …Electron Optics Facility Hitachi S-4700 FE-SEM FE-SEM Operating Procedure FE-SEM Flashing FE-SEM Flashing Hitachi S-4700 FE-SEM Training Index NOTE: The first user of the day must flash the tip. See FE-SEM Form and Function 1 for the flashing sequence. 1.Despite over 67% Earth’s surface being covered by water bodies, ... HITACHI S-4700). The static contact angles of the droplets (5 μL) were measured using an FDSA Magic Droplet-100 contact angle ...The morphology and size of the samples were observed using a Hitachi S-4700 scanning electron microscopy (SEM) and transmission electron microscopy (TEM, Tecnai G2F30 S-Twin, 300 kV accelerating voltage). The samples were dispersed in absolute ethanol and ultrasonicated before TEM characterization.

This is a simplified manual. It is recommended to read and study the original manual. 2. Terms 2.1. RP = Rotary Pump, 2.2. IP = Ion Pump, 2.3. DP = oil Diffusion Pump, 2.4. S.C. = Specimen Chamber = main chamber, 2.5.a Hitachi S-4700 SEM in the Scanning Microscopy Laboratory of Biological and Geological Sciences of the Jagiellonian University. In addition more than 40 traps of G. /obata * G. violacea f. Giant were removed from the soil, cut and observed by light microscopy to check what kind of soil organisms could be found inside them. ...Hitachi S-4700 FE-SEM; FE-SEM FAQs; Also in this section. Instrumentation. FEI 200kV Titan Themis STEM; Hitachi FB-2000A FIB; Hitachi S-4700 FE-SEM. Introduction ...FE-SEM Imaging Techniques. Hitachi S-4700 FE-SEM Training Index. Backscatter Imaging. Charging. Specimen Types. Imaging Techniques: Backscatter Imaging. Top.SEM images and EDS mapping/line scans were measured using a Hitachi S-4700 cold field emission SEM with an integrated Oxford Inca EDS system. The SEM images for examining the particle morphology were obtained using an accelerating voltage of 5 kV and a current of 15 μA. For cross-sectional SEM imaging and EDS, fresh electrodes were …Electron Optics Facility Hitachi S-4700 FE-SEM FE-SEM Internal Components FE-SEM Internal Components Hitachi S-4700 FE-SEM Training Index Electron Gun Chamber Vacuum sealed chamber that contains the field emission gun. A pneumatic valve seals the gun chamber in the event of an accidental vacuum vent.Despite over 67% Earth’s surface being covered by water bodies, ... HITACHI S-4700). The static contact angles of the droplets (5 μL) were measured using an FDSA Magic Droplet-100 contact angle ...All Pelco Modular SEM Specimen Holders have an M4 threaded connection and are compatible with any Hitachi SEM with an M4 thread stage adapter; ... T-Base Adapter for Hitachi S-800, S-4000, S-4100, S-4200, S-4300, S-4500, S-4700 and S-3600N SEM's. Average lead time: 30 days. £268.71. Average lead time: 30 days. Down. Up. ADD TO …10 Hitachi S-4700 Manual-Updated 032117_08012018 . SET IMAGING PARAMETERS * [From OLD version] Switch GUN VALVE to OPEN/AUTO. The valve can be kept on …27 sie 2022 ... Hitachi, S-4700-II ; Hitachi, S-4800 ; Hitachi, S-5200 ; Hitachi, S-6000.

Hitachi S-4700 FESEM . Location: B18 McNutt. Operator: Clarissa Wisner phone: (573) 341-4393 email: [email protected] Faculty Contact: Dr. Scott Miller phone: (573 ...

Hitachi S-4700-II SEM. Location: CA USA. Condition: Refurbished Hitachi S-4700-II. Type II stage with 5 axis motorization . Type I load lock, 4 inch (optional 6 inch) . Full control pad . CD Measurement . Turbo Pump . Upgrade to Windows XP Pro. Valid time: Subject to prior sale without notice. Appreciate your time. Price: Pls email us.SEM STORY 지기 지에스이엠 입니다. 최근 H대학교로 납품된 중고 FE-SEM 모델인 S-4700 제품을 소개드릴까 합니다. HITACHI (일본) 제품인 S-4700 모델은, 2000년도 초반에 국내시장에 본격적으로 판매되기 시작했으며. 전 세계적으로 판매된 수량이 많기 때문에. 약 20년 ...Are you in need of a Hitachi manual for your appliances or machinery? Look no further. With the advancement of technology, accessing Hitachi manuals online has never been easier. In this comprehensive guide, we will walk you through the var...HITACHI. S-4700. Field Emission Scanning Electron Microscope (FE-SEM), 8" Main unit: FE tip (4) BARION Ion pumps Turbo pump: BOC EDWARDS STP 301H Stage: Type 2 (5 Axis motor) (2) SE Detectors Ion pump power: Electron EDS, EDAX (Normal operation) included Display unit: Monitor: LG LCD 19" HP COMPAQ Deskpro computer Stage control Image control ...Hitachi S-4700 FEGSEM Computer Startup and Gun Flash Procedure The flash procedure helps to establish stable operation of the cold field-emission electron gun by driving excess adsorbed gas molecules from the guns cathode, or electron emitter. This is done by briefly heating the cathode to high temperature.The FE-SEM is commonly used at low accelerating voltages and small working distances in order to produce high-resolution images. The height gauge allows for accurate positioning of the specimen close to the lens. If the specimen is too tall and one decreases the working distance, there is a risk of hitting the lens, or worse, the EDS detector.11 paź 2014 ... Hitachi S4700 Field Emission Microscope. What the heck is a “Scanning Electron” Microscope. It is a microscope that uses electrons to ...The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope capable of high resolution imaging. With an accelerating voltage ranging from 0.5 to 30kV the FE-SEM has a magnification range between 30X and 500,000X with spatial resolution of up to 1.5 nm

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Scanservice Corporation has many Electron Microscopes for sale, all working and in good condition. Verios, Helios, FEI, Hitachi, JEOL, Zeiss, XL-30, S-3000.S-4700の新しい二次電子検出法の特長と応用 (533KB) 詳細リンク: sem107: 概要: 近年、半導体デバイスの例にみられるように多くの分野でプロセスの微細化や材料の複合化が進められています。The phase structure of ITO NPs was characterized by Ultima IV X-ray diffractometer (XRD, Japan Rigaku); HITACHI S-4700 scanning electron microscope (SEM, Hitachi, Japan) was used to test the morphology of the powders, and the digital four-probe resistance meter was used to detect the powder resistance. ... Yang S, Zhang C, Yang …SEM / TEM / FIB : HITACHI S-4700 I - - Specimen stage: manual stage - Imaging modes: (2) SE Detectors - Resolution: 1.5 nm at 15 kV, 2.1 nm at 1 kV - Accelerating voltage: 0.5 kV to 30 kV (in 100 V steps) - Operating system: Windows 95 : Type I Cold Field Emission Gun Scanning Electron Microscope (Cold FEG-SEM)View & download of more than 23803 Hitachi PDF user manuals, service manuals, operating guides. Air Conditioner, Projector user manuals, operating guides & specifications. Sign In Upload. Manuals; ... HA-4700 . Service Manual. HA-6800 . Service Manual. HA-7700 . Service Manual. HA-M33 ...The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin ...Hitachi S-4700 FE-SEM. After selecting Condenser Alignment, the image begins to shift in both the X (horizontal) and Y (vertical) directions. To correct this, it is easiest to eliminate shift first in one direction and then the other. Turn the Y alignment knob until the image shifts only horizontally in the X direction.HITACHI S-4700 S4700 4700. If you have any question about repairing write your question to the Message board. For this no need registration. If the site has helped you and you also want to help others, please Upload a manual, circuit diagram or eeprom that is not yet available on the site. Have a nice Day! S-4700 10.0kV 7.0mm x150k YAGBSE 300nm S-4700 10.0kV 3.6mm x150k SE U S-4700 10.0kV 3.6mm x150k SE U A) Normal secondary electron image 30Bnm B) Secondary electron image recorded by depressing the signal which has energies at 50 ev or lower Fig. 4 Observation of a catalyst C) Backscattered electron image recorded by using a separate YAG BSEThe phase structures of the materials were examined by XRD analyses using Cu Ka radiation in the 2θ range from 20° to 60°, with a scanning step of 0.01°. The scanning electron microscopy (SEM, Hitachi S-4700) was used to observed the surface profile of Al 0.023 (Sn 2 Se 3) 0.977 materials. In order to measure the reflectivity change in real ...Model F-4700 (Warranty period for free replacement due to lamp failure is up to 6 months or 500 hours.) Model F-4600 500 hours 1,000 hours 2x longer lifetime Hitachi fluorescence spectrophotometers have a dynamic range with 6 or more orders of magnitude, resulting from our unique circuit-pro-cessing technology. ….

Scanning electron microscopy (SEM) micrographs were recorded with a Hitachi S-4700 Type II FE-SEM (Tokyo, Japan) instrument, which operates using a cold field ...Hitachi S-4700 FE-SEM; FE-SEM Operating Procedure; FE-SEM Flashing; Also in this section. Instrumentation. FEI 200kV Titan Themis STEM; Hitachi FB-2000A FIB; Hitachi S-4700-II FESEM, Refurbished. Hitachi TM1000 Tabletop Scanning Electron Microscope (SEM) Jeol JSM 7000F SEM Field Emission Scanning Electron Microscope. The stubs are transferred to a suitable holder and stored in the desiccator before imaging. The samples are observed in a field-emission SEM with a backscatter electron detector using the manufacturer’s guidelines. In this study, SEM images were taken with a Hitachi S-4700 field-emission SEM, or FEI Helios 660 FIB-SEM microscope.System Overview. The Hitachi S-4700 is a field emission scanning electron microscope (FE-SEM). More powerful than a standard SEM, the S-4700, under optimal conditions, can magnify images upwards of 500,000 times and resolve features to 2 nanometers. The FE-SEM is commonly used at low accelerating voltages and small working distances in order to produce high-resolution images. The height gauge allows for accurate positioning of the specimen close to the lens. If the specimen is too tall and one decreases the working distance, there is a risk of hitting the lens, or worse, the EDS detector.May 1, 2016 · The scanning electron micrographs, equipped with an energy dispersive X–ray analysis (EDX) detector were taken on a Hitachi S–4700 field emission–scanning electron microscope (FE–SEM). The Pd content of the catalyst was determined by a Perkine Elmer ICP analyzer. Hitachi FB-2000A FIB; Hitachi S-4700 FE-SEM. Introduction; Basic Science; External Components; Internal Components; Software; Safety Procedures; Operating Procedure; Imaging Techniques; Microanalysis; FAQs; Troubleshooting; Philips XL 40 ESEM; Specimen Preparation; Supplies; A–ZHITACHI S-4700 is a powerful and reliable scanning electron microscope (SEM), widely used in research and industry for its versatile imaging modes, powerful imaging capabilities, increased convenience, and enhanced safety features such as its triple safety cabinet, allowing for imaging with nanoscale resolution. Hitachi s 4700, The Hitachi S-4700 FE-SEM is a scanning electron microscope used for detailed image analysis of devices and circuits fabricated in the NanoFab. Under ideal conditions, it can magnify images up to 500 kX and can resolve features down to 2 nm. It also is equipped with an energy dispersive X-ray analysis tool to identify elemental materials. , This is a simplified manual. It is recommended to read and study the original manual. 2. Terms 2.1. RP = Rotary Pump, 2.2. IP = Ion Pump, 2.3. DP = oil Diffusion Pump, 2.4. S.C. = Specimen Chamber = main chamber, 2.5., Hitachi Construction Machinery will release earnings for Q2 on October 27.Analysts predict earnings per share of ¥22.54.Go here to track Hitachi C... Hitachi Construction Machinery will release figures for Q2 on October 27. 2 analysts expec..., HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This …, Field emission scanning electron microscopy was carried out on a Hitachi S-4700 Cold-FESEM working at 20 kV. The specific surface area was determined by the Brunauer-Emmett-Teller (BET) method in a Monosorb Analyzer MS-13 QuantaChrome (Boca Raton, FL, USA)., The morphologies of the samples were observed by scanning electron microscopy (SEM, Hitachi S-4700) which was operated at 20.0 kV. Energy-dispersive spectrum (EDS) characterization was performed with an EDX system attached to SEM. X-ray photoelectron spectroscopy (XPS, ..., Oct 11, 2014 · The Hitachi S4700 is a Field Emission Scanning Electron Microscope It has a resolution of 2.3 nm, about 0.00003 the size of a human hair. Magnification range is 250x-500,000x. Typical magnifications used 250x-200,000x Samples include: • Thin films • Ceramics • Metals • Biological • Composites • Polymers 76.6 m. , Principal equipment includes a Hitachi 7100 TEM and a Hitachi S-4700 cold field emission SEM. ... The facility is staffed by a professional electron microscopist ..., The structural changes of CS after NaOH pretreatment were determined by a Hitachi S-4700 (Japan) scanning electron microscopy (SEM). The pH value was measured by pH meter (Mettler Toledo, USA) equipped with a le438 electrode. ... Rincon, B., Heaven, S., Banks, C.J., Zhang, Y.: Anaerobic digestion of whole-crop winter wheat silage for …, The scanning electron micrographs, equipped with an energy dispersive X–ray analysis (EDX) detector were taken on a Hitachi S–4700 field emission–scanning electron microscope (FE–SEM). The Pd content of the catalyst was determined by a Perkine Elmer ICP analyzer. Substances were quantified by gas chromatography (GC) on an Agilent …, Feb 28, 2019 · The Hitachi S-4700 SEM is equipped with a snorkel lens that allows for both an upper through-the-lens (TTL) detector and a lower Everhart-Thornley (E-T) detector. Accelerating voltage = 0.5 to 30 kV. Magnification up to 500,000x. Resolution of: 1.5nm at 15kV accelerating voltage and 12mm working distance 2.5nm at 1kV accelerating voltage and 2 ... , A Hitachi S-4700 scanning electron microscope (SEM) was used to study the morphology of the silica powders. Specific surface areas of silica powders were determined by N 2 adsorption (BET) using ASAP 2020M+C instrument (Micrometrics Instrument Co.)., 10 Hitachi S-4700 Manual-Updated 032117_08012018 . SET IMAGING PARAMETERS * [From OLD version] Switch GUN VALVE to OPEN/AUTO. The valve can be kept on …, SEM & TEM : HITACHI S-4700 - : Buy Sell. How It Works. Dashboard. Log In. Register. Contact Us. No Results. Back to Previous. HITACHI S-4700. Created On. March 18th, 2021. Guaranteed Accurate as of. 2 months ago. Copied! Share. March 18th, 2021. 2 months ago. Copied! Share. See Full Gallery (0 Photos) Make Offer. Request Info / Contact Account ..., HITACHI S-4700 is a powerful and reliable scanning electron microscope (SEM), widely used in research and industry for its versatile imaging modes, powerful imaging capabilities, increased convenience, and enhanced safety features such as its triple safety cabinet, allowing for imaging with nanoscale resolution., S-4700の新しい二次電子検出法の特長と応用 (533KB) 詳細リンク: sem107: 概要: 近年、半導体デバイスの例にみられるように多くの分野でプロセスの微細化や材料の複合化が進められています。 , The morphology of the ZnO materials was evaluated by field emission scanning electron microscopy (FE-SEM, Hitachi S-4700). The distribution of the different blend components on the films was analyzed using confocal Raman microscopy on a CRM-Alpha 300 RA microscope (WITec, Ulm, Germany) equipped with Nd:YAG dye later …, Hitachi S-4700 field emission scanning electron microscope (Hitachi, Tokyo, Japan) was utilized to obtain the scanning electron microscopy (SEM) images. The surface characteristics of surface area and porosity were measured with a Surface Characterization Analyzer ASAP2460 (Micromeritics, USA). The Fourier transform infrared spectroscopy …, Hitachi S-4700-II SEM. Location: CA USA. Condition: Refurbished Hitachi S-4700-II. Type II stage with 5 axis motorization . Type I load lock, 4 inch (optional 6 inch) . Full control pad . CD Measurement . Turbo Pump . Upgrade to Windows XP Pro. Valid time: Subject to prior sale without notice. Appreciate your time. Price: Pls email us., Hitachi S-4700 FE-SEM; FE-SEM Basic Science; FE-SEM Form and Function 2; Also in this section. Instrumentation. FEI 200kV Titan Themis STEM; Hitachi FB-2000A FIB;, HITACHI 4700 FE-SEM COLD FIELD EMMISION 2 STARTING CONDITIONS 3-4 SPECIMEN LOADING 5 SAMPLE INSERTION 6-7 SAMPLE WITHDRAWAL 7 SET IMAGE PARAMETERS 8-10 OBTAINING AN IMAGE 11 ALIGNMENT 12 GENERAL OPERATION 13-14 IMAGE ACQUISITION 15 BACKSCATTER ELECTRON IMAGING 16 COMPUTER …, HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This …, Hitachi S4700 FE-SEM is a powerful tool for topographic analysis at nano-scale levels, which uses windows XP-based computerized operating system with the high- ..., Jul 16, 2015 · Arizona State University NanoFab HITACHI S-4700 FESEM .....Hitachi Service contact: Phone: 800-253-3053 (Ser. No. 9318-08) EDAX Service contact: Phone: 800-535-3329: No longer under HITACHI HITACHI 5 HITACHI 5.OAh HITACHI 22mm WR22SE HITACHI 25mm WR25SE HITACHI HITACHI WR ISSA , Hitachi S-4700 FE-SEM; FE-SEM Microanalysis; Also in this section. Instrumentation. FEI 200kV Titan Themis STEM; Hitachi FB-2000A FIB; Hitachi S-4700 FE-SEM ... , Recently, we traded a Hitachi tungsten (W) scanning electron microscope and replaced it with a Hitachi S-4700 cold field emission SEM running on SEMView8000 ..., match case limit results 1 per page. hitachi 4700 fe-sem updated 12/19/13 cold field emission 2 starting conditions 3-4 specimen loading 5 sample insertion 6-7 sample withdrawal 7 set image parameters 8-10 obtaining an image 11 alignment 12 general operation 13-14 image acquisition 15 backscatter electron imaging 16 computer startup …, SEM Hitachi S-4700 user manual. 1. Warnings and recommendations. Be sure to read the following remarks: 1.1. This equipment belongs to VAN Partners. Let's handle it with much care, 1.2. Before exchanging the sample, always check that the stage is in its initial position: , Tour of the software for the Hitachi S-4700 Scanning Electron Microscope, including icons and windows., FE-SEM Basic Science. Hitachi S-4700 FE-SEM Training Index. Form and Function 1. Form and Function 2. Chemical Analysis. Basic Science: Form and Function 1. Top., Focus on an area at high magnification. (Use the magnification at which you will be imaging, as charging is related to magnification strength.) Let the beam sit on the sample for a few seconds. Reduce the magnification and observe the sample. If there is a bright spot, the sample is experiencing negative charging; lower the voltage., Hitachi FB-2000A FIB; Hitachi S-4700 FE-SEM; Philips XL 40 ESEM; Specimen Preparation; Supplies; A–Z; Access. Training; Authorization; Reservations; Policy; Contact; Safety; Search Clear Search Input Search …, Morphologies of the Al-FumA electrodes before and after electrochemical cycles were observed by scanning electron microscope (SEM) using a Hitachi S-4700 operated at 15 kV accelerating voltage. Transmission electron microscope (TEM) images of the electrodes were obtained using Tecnai G2 F20 S-TWIN. 3. Results and discussion3.1.